Your browser doesn't support javascript.
loading
Show: 20 | 50 | 100
Results 1 - 1 de 1
Filter
Add filters








Language
Year range
1.
Journal of Zhejiang University. Science. B ; (12): 1135-1140, 2005.
Article in English | WPRIM | ID: wpr-263249

ABSTRACT

This paper reports the surface morphology and I-V curves of porous silicon (PS) samples and related devices. The observed fabrics on the PS surface were found to affect the electrical property of PS devices. When the devices were operated under different external bias (10 V or 3 V) for 10 min, their observed obvious differences in electrical properties may be due to the different control mechanisms in the Al/PS interface and PS matrix morphology.


Subject(s)
Electrochemistry , Methods , Electrodes , Electromagnetic Fields , Gold , Chemistry , Materials Testing , Molecular Conformation , Porosity , Silicon , Chemistry , Surface Properties
SELECTION OF CITATIONS
SEARCH DETAIL